Download Palladium Nanoparticles by Yang C.-C., Wan C.-C., Lee C.-L. PDF

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By Yang C.-C., Wan C.-C., Lee C.-L.

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Springer 2004 dimer adatom stacking distributed Bragg reflector dendritic cells distributed feedback dynamic force microscopy density functional theory diamond-like carbon digital light processing Derjaguin–Landau–Verwey–Overbeek digital micromirror device Derjaguin–Muller–Toporov density of states dip-pen nanolithography deep reactive ion etching differential scanning calorimetry digital signal processor diphteria toxin double-wall nanotubes E EAM EBD ECR-CVD EDC EDP EDS EELS C C CA CBA CCVD D EFC EFM EHD EL EO EOF EPR ESD embedded atom method electron beam deposition electron cyclotron resonance chemical vapor deposition 1-ethyl-3-(3-diamethylaminoprophyl) carbodiimide ethylene diamine pyrocatechol energy dispersive X-ray spectrometer electron energy loss spectrometer/spectroscopy electrostatic force constant electric field gradient microscopy electrohydrodynamic electro-luminiscence electro-osmosis electro-osmotic flow enhanced permeability and retention effect electrostatic discharge F FAD FC FCA FCP FD FE FEM flavin adenine dinucleotide flip chip technique filtered cathodic arc force calibration plot finite difference finite element finite element method/modeling XXXIV List of Abbreviations FET FFM FIB FID FIM FKT FM FM-AFM FMEA FMM FM-SFM FS field-effect transistor friction force microscope/microscopy focused ion beam free induction decay field-ion microscope/microscopy Frenkel-Kontorova-Tomlinson frequency modulation frequency modulation AFM failure mode effect analysis force modulation mode frequency-modulation SFM force spectroscopy G G GIO GMR GOD Gox guanine grazing impact oscillator giant magnetoresistance glucose oxidase flavoenzyme glucose oxidase H HARMEMS HDD HF HOP HOPG HPMA HtBDC HTCS high-aspect-ratio MEMS hard disk drive hydrofluoric acid highly oriented pyrolytic highly oriented pyrolytic graphite hydroxyl polymethacrylamide hexa-tert-butyl-decacyclene high temperature superconductivity I IBD IC ICAM-1 IFM ISE ITO ion beam deposition integrated circuit intercellular adhesion molecule-1 interfacial force microscope indentation size effect indium tin oxide MAP MD MDS ME MEMS MFM MHA MHC MHD MIM MLE MOCVD MP MPTMS MRAM MRFM MRFM MRI MTTF MWCNT manifold absolute pressure molecular dynamics molecular dynamics simulation metal evaporated microelectromechanical systems magnetic field microscope/microscopy 16-mercaptohexadecanoic acid thiol major histocompatibility complex magnetohydrodynamic metal/insulator/metal maximum likelihood estimator metalorganic CVD metal particle mercaptopropyltrimethoxysilane magnetoresistive RAM magnetic resonance force microscopy molecular recognition force microscopy magnetic resonance imaging mean time to failure multiwall carbon nanotube N Kelvin probe force microscopy NTA nTP NVRAM nucleic acid 3-nitrobenzal malonitrile noncontact atomic force microscopy neocarzinostatin nanoelectromechanical systems no moving part National Nanotechnology Initiative near-field scanning optical microscope/microscopy nitrilotriacetate nanotransfer printing nonvolatile random access memories O L LB LCC LDOS LEDs LFA-1 lateral force microscope linear fractional transformation liquid nitrogen low pressure chemical vapor deposition linear quadratic Gaussian loop-transfer recovery low-temperature SPM low-temperature scanning tunneling spectroscopy linear variable differential transformers M Johnson–Kendall–Roberts K KPFM LVDT NA NBMN NC-AFM NCS NEMS NMP NNI NSOM J JKR LFM LFT LN LPCVD LQG LTR LTSPM LTSTS Langmuir–Blodgett leadless chip carrier local density of states light-emitting diodes leukocyte function-associated antigen-1 ODD OMVPE OT OTE OTS optical disk drives organometallic vapor phase epitaxy optical tweezers octadecyltrimethoxysilane octadecyltrichlorosilane Springer Handbook of Nanotechnology B.

Ind. Electron. 42 (1995) 222–233 D. A. Horsley, M. B. Cohn, A. Singh, R. Horowitz, A. P. Pisano: Design and fabrication of an angular 5 Introduction ulus of elasticity, hardness, bending strength, fracture toughness, and fatigue life. Finite element modeling is carried out to study the effects of surface roughness and scratches on stresses in nanostructures. 27 microactuator for magnetic disk drives, J. Microelectromech. Syst. 7 (1998) 141–148 T. Hirano, L. S. Fan, D. Kercher, S. Pattanaik, T. S.

2 Selected bulk properties of SiC and Si(100).............................. 3 Surface roughness and micro- and macroscale coefficients of friction of selected samples ............................................... 4 RMS, microfriction, microscratching/microwear, and nanoindentation hardness data for various virgin, coated, and treated silicon samples ...................................... 5 Summary of micro/nanotribological properties of the sample materials ........................................................

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